• DocumentCode
    3192809
  • Title

    XStatic: A Simulation Based ESD Verification and Debug Environment

  • Author

    Shamnur, Ganesh R. ; Berigei, Rajesh R.

  • Author_Institution
    Nat. Semicond. Corp., Santa Clara
  • fYear
    2008
  • fDate
    17-19 March 2008
  • Firstpage
    441
  • Lastpage
    444
  • Abstract
    Electrostatic discharge, the transfer of charge between bodies that alters device characteristics has become a major reliability concern in the semiconductor industry. Conventional approaches of using ESD testers to detect ESD defects are post-fabrication methods which leave narrow design time for ESD rectification. This paper discusses a CAD approach which captures ESD problems in the design phase enabling designers to build robust ESD structures. The discussed verification platform performs ESD simulations on the design and aids designers to locate and debug the potential ESD failure nodes in the circuit. This approach leads to robust ESD designs with minimal cycle-time and reduces silicon re-spins.
  • Keywords
    electronic design automation; electrostatic discharge; CAD; ESD verification; XStatic; debug environment; electrostatic discharge; silicon respin; Circuit simulation; Circuit testing; Computational modeling; Consumer electronics; Design automation; Electrostatic discharge; Industrial electronics; Protection; Robustness; Voltage; ESD; XStatic;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design, 2008. ISQED 2008. 9th International Symposium on
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    978-0-7695-3117-5
  • Type

    conf

  • DOI
    10.1109/ISQED.2008.4479773
  • Filename
    4479773