Title : 
A moment method solution for the shielding properties of three-dimensional objects above a lossy half space
         
        
            Author : 
Chih-Ping Chang ; Chang-Fa Yang
         
        
            Author_Institution : 
Dept. of Electr. Eng., Nat. Taiwan Inst. of Technol., Taipei, Taiwan
         
        
        
        
        
        
            Abstract : 
The electromagnetic (EM) scattering and shielding properties of structures above a lossy half space have been studied by many investigators. Baertlein (1988) introduced a moment method (MM) solution with a surface formulation and the spectral domain Green´s function for two-dimensional (2-D) perfect electric conductor (PEC) structures over a lossy half space to study the shielding effectiveness of the PEC plates above the ground. This article presents an MM solution to evaluate the EM shielding properties of three-dimensional (3-D) objects over a lossy half space. The MM with the volume formulation and 3-D Green´s functions in the spectral domain is developed, where the 3-D objects can be composed of metallic, dielectric, or magnetic materials.
         
        
            Keywords : 
Green´s function methods; absorbing media; dielectric materials; electromagnetic shielding; electromagnetic wave scattering; integral equations; magnetic materials; method of moments; spectral-domain analysis; 3D Green´s functions; 3D objects; EM shielding properties; dielectric materials; electromagnetic scattering; lossy half space; magnetic materials; metallic materials; moment method solution; perfect electric conductor; shielding effectiveness; spectral domain; spectral domain Green´s function; three-dimensional objects; volume formulation; Boundary conditions; Conductors; Dielectric losses; Electromagnetic scattering; Electromagnetic shielding; Green´s function methods; Magnetic shielding; Moment methods; Space technology; Wires;
         
        
        
        
            Conference_Titel : 
Antennas and Propagation Society International Symposium, 1998. IEEE
         
        
            Conference_Location : 
Atlanta, GA, USA
         
        
            Print_ISBN : 
0-7803-4478-2
         
        
        
            DOI : 
10.1109/APS.1998.701582