Title :
An Approach for a Comprehensive QA Methodology for the PDKs
Author :
Joshi, Sridhar ; Perumal, Ravi ; Gadepally, Kamesh V. ; Young, Mark
Author_Institution :
Nat. Semicond. - Bangalore, Bangalore
Abstract :
Achieving First time Silicon is a necessity to meet the Organization´s bottom line. From the CAD perspective, ensuring quality in the collateral that is supplied to the designers plays a very crucial role in this objective. This paper attempts to capture the evolution of process of achieving high quality process design kits (PDKs).
Keywords :
process design; quality assurance; semiconductor process modelling; technology CAD (electronics); time to market; First time Silicon; PDK; comprehensive QA methodology; high-quality process design kits; time to market; Consumer electronics; Design automation; Job shop scheduling; Manufacturing processes; Process design; Signal design; Signal processing; Silicon; Testing; Time to market; Bugs; Matrix; PDK; Quality; Regression; Test structures; categorization;
Conference_Titel :
Quality Electronic Design, 2008. ISQED 2008. 9th International Symposium on
Conference_Location :
San Jose, CA
Print_ISBN :
978-0-7695-3117-5
DOI :
10.1109/ISQED.2008.4479781
