DocumentCode :
3192978
Title :
A new testing philosophy-differential test
Author :
Ma, Hede ; Liu, Ying
Author_Institution :
Savannah State Coll., GA, USA
fYear :
1993
fDate :
4-7 Apr 1993
Firstpage :
0.666666666666667
Abstract :
A new testing philosophy is proposed which takes advantages of both off-line and on-line testing strategies. A differential testing scheme (DT) is developed based on the new testing philosophy. The DT is capable of testing digital systems on-line without any error detection code but with an initialization at the very beginning. In the forced initialization, at least one-hour random test pattern generation is required if a CPU runs at 20 MHz. Using the natural initialization, the DT will not be effective until the system has run several days or weeks. This means that, once the DT is started by the initialization, it starts without end until power is turned off
Keywords :
digital systems; electronic equipment testing; random processes; 20 MHz; CPU; differential testing; digital systems testing; initialization; off-line testing; on-line testing; random test pattern generation; testing philosophy; Circuit testing; Computer science; Decoding; Digital systems; Hardware; Sequential analysis; Sequential circuits; Statistical analysis; System testing; Transfer functions;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Southeastcon '93, Proceedings., IEEE
Conference_Location :
Charlotte, NC
Print_ISBN :
0-7803-1257-0
Type :
conf
DOI :
10.1109/SECON.1993.465783
Filename :
465783
Link To Document :
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