• DocumentCode
    3192978
  • Title

    A new testing philosophy-differential test

  • Author

    Ma, Hede ; Liu, Ying

  • Author_Institution
    Savannah State Coll., GA, USA
  • fYear
    1993
  • fDate
    4-7 Apr 1993
  • Firstpage
    0.666666666666667
  • Abstract
    A new testing philosophy is proposed which takes advantages of both off-line and on-line testing strategies. A differential testing scheme (DT) is developed based on the new testing philosophy. The DT is capable of testing digital systems on-line without any error detection code but with an initialization at the very beginning. In the forced initialization, at least one-hour random test pattern generation is required if a CPU runs at 20 MHz. Using the natural initialization, the DT will not be effective until the system has run several days or weeks. This means that, once the DT is started by the initialization, it starts without end until power is turned off
  • Keywords
    digital systems; electronic equipment testing; random processes; 20 MHz; CPU; differential testing; digital systems testing; initialization; off-line testing; on-line testing; random test pattern generation; testing philosophy; Circuit testing; Computer science; Decoding; Digital systems; Hardware; Sequential analysis; Sequential circuits; Statistical analysis; System testing; Transfer functions;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Southeastcon '93, Proceedings., IEEE
  • Conference_Location
    Charlotte, NC
  • Print_ISBN
    0-7803-1257-0
  • Type

    conf

  • DOI
    10.1109/SECON.1993.465783
  • Filename
    465783