• DocumentCode
    3193158
  • Title

    Study on the Si-Ge Nanowire MOSFETs with the Core-Shell Structure

  • Author

    Fu, Yue ; He, Jin ; Liu, Feng ; Feng, Jie ; Ma, Chenyue ; Zhang, Lining

  • Author_Institution
    Peking Univ., Shenzhen
  • fYear
    2008
  • fDate
    17-19 March 2008
  • Firstpage
    531
  • Lastpage
    536
  • Abstract
    This paper investigates the transport properties of the silicon-germanium nanowire MOSFETs with core-shell structure by using a finite element numerical method for electronic structure, energy level, and channel current computation. Coupled Poisson´s equation to Schrodinger´s equation for electrostatics calculation and electron structure to current transport equation for channel current computation, the electronic structure, quantized energy levels, relevant wave functions and charge distribution are solved selfconsistently for the core-shell structure MOSFETs. Furthermore, based on these findings, the transistor performances, including the capacitance characteristics and drain current, are also predicted.
  • Keywords
    Ge-Si alloys; MOSFET; Poisson equation; Schrodinger equation; finite element analysis; nanoelectronics; nanowires; semiconductor device models; Poisson equation; Schrodinger equation; capacitance characteristics; channel current computation; charge distribution; core-shell structure; current transport equation; drain current; electron structure; electronic structure; electrostatics calculation; energy level; finite element numerical method; silicon-germanium nanowire MOSFET; transistor performance; wave functions; Distributed computing; Electrons; Electrostatics; Energy states; Finite element methods; Germanium silicon alloys; MOSFETs; Poisson equations; Schrodinger equation; Silicon germanium; core-shell; nanowire; non-classical device modeling; quantum mechanical effect;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design, 2008. ISQED 2008. 9th International Symposium on
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    978-0-7695-3117-5
  • Type

    conf

  • DOI
    10.1109/ISQED.2008.4479791
  • Filename
    4479791