Extraction of the lumped elements for the microstrip discontinuity´s equivalent circuit

The authors describe a method for extracting lumped elements associated with equivalent circuits to microstrip discontinuities from the S-parameters of embedded discontinuities with analytical expressions. They indicate how they have derived a relation between the S-parameters associated with the simulated embedded discontinuity with the Z-parameters of the discontinuity itself. The derived relation plays a key role in extracting the lumped elements with analytical expressions. The mismatch effects that may be encountered at the transitions of the embedded discontinuity to connecting lines are included. The approach is formulated in general terms and the method is consequently applicable to an arbitrary embedded discontinuity.<>