DocumentCode :
3193394
Title :
Determination and analysis of the optical parameters of polymer thin film based on spectrum
Author :
Cai, Guoxiong ; Zhou, Jianhua ; You, Baiqiang
Author_Institution :
Electron. Eng. Dept., Xiamen Univ., Xiamen
fYear :
2008
fDate :
25-27 May 2008
Firstpage :
623
Lastpage :
627
Abstract :
A method to determine the optical parameters of polymer thin film by use of the transmission spectrum is proposed, with the improved simulated annealing algorithm developed to perform its inverse calculation. A special phenomenon due to the almost equal refractive index between film and substrate, that is, the small waves on spectrum curves which make the information of film thickness losing, has been discussed in detail. Based on the tested transmission spectrums of polymer optical thin films fabricated on K9 glass substrates, the dispersion curve of refractive index in visible band is figured out. Its calculated refractive index in the wavelength of 1547 nm is 1.3933, with the accuracy higher than 0.58% by comparing with the one measured by traditional coupled prism method. The analyzed result shows that the improved algorithm works well, by which the calculated optical parameters can converge to the right values.
Keywords :
optical films; optical polymers; refractive index; simulated annealing; K9 glass substrates; coupled prism method; dispersion curve; inverse calculation; optical parameters; polymer thin film; refractive index; simulated annealing algorithm; wavelength 1547 nm; Glass; Optical films; Optical polymers; Optical refraction; Optical variables control; Polymer films; Refractive index; Simulated annealing; Substrates; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Communications, Circuits and Systems, 2008. ICCCAS 2008. International Conference on
Conference_Location :
Fujian
Print_ISBN :
978-1-4244-2063-6
Electronic_ISBN :
978-1-4244-2064-3
Type :
conf
DOI :
10.1109/ICCCAS.2008.4657850
Filename :
4657850
Link To Document :
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