• DocumentCode
    3193466
  • Title

    MAISE: An Interconnect Simulation Engine for Timing and Noise Analysis

  • Author

    Liu, F. ; Feldmann, P.

  • Author_Institution
    IBM Austin Res. Lab, Austin
  • fYear
    2008
  • fDate
    17-19 March 2008
  • Firstpage
    621
  • Lastpage
    626
  • Abstract
    This paper describes MAISE, an embedded linear circuit simulator for use mainly within timing and noise analysis tools. MAISE achieves the fastest possible analysis performance over a wide range of circuit sizes and topologies by an adaptive architecture that allows applying the most efficient combination of model reduction algorithms and linear solvers for each class of circuits. The main pillar of adaptability in MAISE is a novel nodal-analysis formulation (PNA) which permits the use of symmetric, positive-definite Cholesky solvers for all circuit topologies. Moreover, frequently occurring special cases, e.g., inductor-resistor tree structures result in particular types of matrices that are solved by an even faster linear time algorithm. Model order reduction algorithms employed in MAISE exploit symmetry and positive-definiteness whenever available and use symmetric-Lanczos iteration and nonstandard inner-products for generating the Krylov subspace basis. The efficiency of the new simulator is supported by a wide range of industrial examples.
  • Keywords
    circuit noise; circuit simulation; interconnections; iterative methods; linear network synthesis; matrix algebra; network topology; reduced order systems; Krylov subspace basis; MAISE; circuit topology; embedded linear circuit simulator; interconnect simulation engine; linear time algorithm; matrix algebra; model reduction algorithm; nodal-analysis formulation; symmetric positive-definite Cholesky solver; symmetric-Lanczos iteration; timing and noise analysis; Algorithm design and analysis; Analytical models; Circuit noise; Circuit simulation; Circuit topology; Engines; Integrated circuit interconnections; Linear circuits; Performance analysis; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design, 2008. ISQED 2008. 9th International Symposium on
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    978-0-7695-3117-5
  • Type

    conf

  • DOI
    10.1109/ISQED.2008.4479809
  • Filename
    4479809