DocumentCode
3193515
Title
2D Decomposition Sequential Equivalence Checking of System Level and RTL Descriptions
Author
Zhu, Dan ; Li, Tun ; Guo, Yang ; Li, Si-Kun
Author_Institution
Nat. Univ. of Defense Technol., Changsha
fYear
2008
fDate
17-19 March 2008
Firstpage
637
Lastpage
642
Abstract
Symbolic simulation-based approach is viable for the sequential equivalence checking (SEC) of SLM-vs.-RTL. However, it can\´t avoid the storage explosion introduced by the explosion of the BDD sizes for large designs. For scalability, we introduce two kinds of decomposition techniques: One is the equivalence checking oriented program slicing; the other is the hierarchical insertion of logic cut- points. And a 2D decomposition SEC method of SLM-vs.-RTL is presented. "2D decomposition" means decomposition in the space dimension and the time dimension. The verification model is only built for the program slices of a single output variable for each time, which limits the usage of memory. During checking the equivalence of the program slices, the logic cutpoints are inserted to split the verification model of the program slices in the time dimension, which controls the storage explosion further. The promising experimental results demonstrate the benefits brought by our 2D decomposition method.
Keywords
decomposition; logic design; program slicing; program verification; sequential circuits; 2D decomposition; RTL descriptions; logic cutpoints; oriented program slicing; program verification; register transfer level; scalability; sequential equivalence checking; space dimension; system level; time dimension; Binary decision diagrams; Circuit simulation; Computational modeling; Computer science; Computer simulation; Data structures; Explosions; Hardware design languages; Logic; Scalability; Program slicing; Sequential equivalence checking; cutpoints;
fLanguage
English
Publisher
ieee
Conference_Titel
Quality Electronic Design, 2008. ISQED 2008. 9th International Symposium on
Conference_Location
San Jose, CA
Print_ISBN
978-0-7695-3117-5
Type
conf
DOI
10.1109/ISQED.2008.4479812
Filename
4479812
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