• DocumentCode
    3193607
  • Title

    Assets of source pull for NVNA based load pull measurements

  • Author

    Gasseling, Tony ; Gatard, Emmanuel ; Charbonniaud, Christophe ; Xiong, Alain

  • Author_Institution
    AMCAD Eng., Limoges, France
  • fYear
    2012
  • fDate
    22-22 June 2012
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    This study deals with Vector Network Analyser based source-load-pull measurements. While a lot of papers demonstrated the influence of harmonic load impedances on PAE performances and time domain RF waveforms shaping, the harmonic source-pull topic has been a little bit less addressed. When using a traditional power meter based source/load-pull bench, source pull measurements are mandatory. Indeed, for a fixed power level and a given set of load impedances, the source pull optimization highlights the conditions to match the transistor´s input access. Nowadays, modern Vector Network Analyser based source-load pull systems provide the direct measurements of the transistor input impedance. Thus, from the theoretical definition of any arbitrary source impedance, the mismatch calculus between input and source impedances is possible. It gives rise to a new kind of virtual source pull measurements. Some of us have called this method “magic source pull”. This method and its limitations will be explained, comparison between traditional source pull and Vector Network Analyser based “magic source pull” will be provided.
  • Keywords
    impedance matching; load (electric); network analysers; power amplifiers; power transistors; NVNA based load pull measurements; direct transistor input impedance measurements; magic source pull; mismatch calculus; nonlinear vector based measurements; source impedances; vector network analyser based source-load-pull measurements; virtual source pull measurements; Impedance; Impedance measurement; Microwave measurements; Power measurement; Transducers; Transistors; Tuners; Source pull; load pull; nonlinear vector based measurements; power amplifier design; transistor characterization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Measurement Conference (ARFTG), 2012 79th ARFTG
  • Conference_Location
    Montreal, QC
  • Print_ISBN
    978-1-4673-1229-5
  • Electronic_ISBN
    978-1-4673-1230-1
  • Type

    conf

  • DOI
    10.1109/ARFTG79.2012.6291177
  • Filename
    6291177