• DocumentCode
    3193628
  • Title

    Impact of Tone Interference on Multiband OFDM

  • Author

    Snow, Chris ; Lampe, Lutz ; Schober, Robert

  • Author_Institution
    Dept. of Electr. & Comput. Eng., British Columbia Univ.
  • fYear
    2006
  • fDate
    24-27 Sept. 2006
  • Firstpage
    249
  • Lastpage
    254
  • Abstract
    We study the effect of narrowband interference on the error rate of coded multicarrier systems operating over frequency-selective, quasi-static fading channels with non-ideal interleaving. For this purpose we model the interfering signal as a sum of tone interferers, and develop an error-rate estimation method to approximate the performance of the system over each realization of the channel. This method is suitable for obtaining the outage as well as average performance of the system. The analysis is used to quantify the impact of tone interference on the multiband orthogonal frequency division multiplexing (OFDM) proposal for high data-rate ultra-wideband (UWB) communication. The results indicate that tone interference may have a significant impact on multiband OFDM, but that this performance degradation can be mitigated by the use of erasure marking and decoding at the receiver, assuming the receiver can acquire knowledge of the subcarriers impacted by the interfering signal
  • Keywords
    OFDM modulation; approximation theory; decoding; error statistics; fading channels; interference (signal); modulation coding; ultra wideband communication; OFDM; UWB; approximation; coded multicarrier systems; decoding; error-rate estimation method; frequency-selective channel; multiband orthogonal frequency division multiplexing; narrowband interference; quasistatic fading channel; receiver; signal interference; tone interference; ultra-wideband communication; Degradation; Error analysis; Estimation error; Fading; Interference; Interleaved codes; Narrowband; OFDM; Proposals; Ultra wideband technology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultra-Wideband, The 2006 IEEE 2006 International Conference on
  • Conference_Location
    Waltham, MA
  • Print_ISBN
    1-4244-0101-1
  • Electronic_ISBN
    1-4244-0102-X
  • Type

    conf

  • DOI
    10.1109/ICU.2006.281558
  • Filename
    4059453