Title :
Traceability via precision dimensional measurements of WM-864 (WR-03) waveguide standard shims including comparison between NPL and NMIJ
Author :
Horibe, Masahiro ; Ridler, Nick ; Wilson, Alan
Author_Institution :
Nat. Inst. of Adv. Ind. Sci. & Technol., Nat. Metrol. Inst. of Japan, Tsukuba, Japan
Abstract :
This paper presents a measurement comparison of WM-864 (WR-03) precision waveguide lines for use as reference standards in the Thru-Reflect-Line (TRL) calibration method for VNAs at millimeter and sub-millimeter wave frequencies (in this case, from 220 GHz to 330 GHz). The measurement is established using three-dimensional Coordinate Measuring Machines (CMMs) fitted with styluses that contain small-sized tips. The paper includes a comparison of these dimensional measurements, made independently at the national metrology institutes (NMIs) of Japan and the United Kingdom. Characteristics (e.g. reflection characteristics and scattering parameters at the waveguide interface) of these waveguide lines in the frequency-domain are also calculated and compared between these two NMIs.
Keywords :
coordinate measuring machines; network analysers; NMIJ; NPL; VNA; WM-864 waveguide standard shims; frequency 220 GHz; frequency 330 GHz; frequency-domain; measurement comparison; reference standards; submillimeter wave frequencies; three-dimensional coordinate measuring machines; thru-reflect-line calibration method; traceability via precision dimensional measurements; vector network analyser; Apertures; Calibration; Frequency measurement; Measurement uncertainty; Standards; Temperature measurement; Uncertainty; Comparison of measurement; Dimensional measurements; Rectangular waveguide; TRL line standards; WM-864; scattering parameter;
Conference_Titel :
Microwave Measurement Conference (ARFTG), 2012 79th ARFTG
Conference_Location :
Montreal, QC
Print_ISBN :
978-1-4673-1229-5
Electronic_ISBN :
978-1-4673-1230-1
DOI :
10.1109/ARFTG79.2012.6291180
