Title :
Characterizing Intra-Die Spatial Correlation Using Spectral Density Method
Author :
Fu, Qiang ; Luk, Wai-Shing ; Tao, Jun ; Yan, Changhao ; Zeng, Xuan
Author_Institution :
Fudan Univ., Shanghai
Abstract :
A spectral domain method for intra-die spatial correlation function extraction is presented. Based on theoretical analysis of random field, the spectral density, as the spectral domain counterpart of correlation function, is employed to estimate the parameters of the correlation function effectively in the spectral domain. Compared with the existing extraction algorithm in the original spatial domain, the proposed method can obtain the same quality of results in the spectral domain. In actual measurement process, the unavoidable measurement error with arbitrary frequency components would greatly confound the extraction results. A filtering technique is further proposed to diminish the high frequency components of the measurement error and recover the data from noise contamination for parameter estimation. Experimental results have shown that the proposed method is practical and stable.
Keywords :
correlation methods; integrated circuit design; integrated circuit modelling; integrated circuit testing; semiconductor technology; correlation function; extraction algorithm; intra-die spatial correlation; parameter estimation; random field; spectral density method; CMOS technology; Circuit synthesis; Contamination; Context modeling; Data mining; Measurement errors; Parameter estimation; Pollution measurement; Robustness; Semiconductor device modeling; intra-die variation; spatial correlation; spectral density; spectral domain;
Conference_Titel :
Quality Electronic Design, 2008. ISQED 2008. 9th International Symposium on
Conference_Location :
San Jose, CA
Print_ISBN :
978-0-7695-3117-5
DOI :
10.1109/ISQED.2008.4479826