Title :
Repeatability of waveguide flanges with worst-case tolerances in the 500–750 GHz band
Author :
Li, Huilin ; Kerr, Anthony R. ; Hesler, Jeffrey L. ; Weikle, Robert M., II
Author_Institution :
Charles L. Brown Dept. of Electr. & Comput. Eng., Univ. of Virginia, Charlottesville, VA, USA
Abstract :
Dimensional tolerances of waveguide flanges impose a major limitation on precise measurements above ~100 GHz. At present, the P1785 working group of the IEEE is considering several improved flange designs for rectangular waveguides used above 110 GHz. This paper presents a study of the connection repeatability of some competing designs with worst-case dimensions. Measurements are performed in the 500-750 GHz (WR-1.5 or WM-380) frequency band.
Keywords :
flanges; rectangular waveguides; submillimetre wave measurement; tolerance analysis; units (measurement); IEEE P1785 working group; connection repeatability; frequency 500 GHz to 750 GHz; precise measurement; rectangular waveguide; waveguide flange; worst-case dimension; worst-case dimensional tolerance; Calibration; Extraterrestrial measurements; Flanges; Frequency measurement; Microwave measurements; Standards; Millimeter-wave; standards; sub-millimeter wave; waveguide flanges; waveguide interfaces; waveguides;
Conference_Titel :
Microwave Measurement Conference (ARFTG), 2012 79th ARFTG
Conference_Location :
Montreal, QC
Print_ISBN :
978-1-4673-1229-5
Electronic_ISBN :
978-1-4673-1230-1
DOI :
10.1109/ARFTG79.2012.6291185
