Title :
Experiment and analysis of microwave termination stability over temperature and time
Author_Institution :
Dept. of Quality Assurance, Anritsu Co., Morgan Hill, CA, USA
Abstract :
A microwave termination is a single-port, 50 ohm device. We have developed experiments to determine the temperature stability on the VSWR performance of terminations. Measurements were made in a temperature and humidity chamber and by a vector network analyzer (VNA) outside the chamber. Accuracy of terminations will change with time. It is also desirable to understand the short-term stability and its implication towards the long-term drift. Empirical study shows a good agreement by using the modified linear regression technique.
Keywords :
humidity measurement; microwave devices; microwave measurement; network analysers; regression analysis; stability; temperature measurement; time measurement; VNA; VSWR performance; humidity chamber measurement; long-term drift; microwave measurement; microwave termination stability; modified linear regression technique; resistance 50 ohm; short-term stability; single-port device; temperature measurement; temperature stability; vector network analyzer; Calibration; Microwave measurements; Performance evaluation; Stability analysis; Temperature; Temperature measurement; Thermal stability; coaxial termination; drift; linear regression; temperature variation;
Conference_Titel :
Microwave Measurement Conference (ARFTG), 2012 79th ARFTG
Conference_Location :
Montreal, QC
Print_ISBN :
978-1-4673-1229-5
Electronic_ISBN :
978-1-4673-1230-1
DOI :
10.1109/ARFTG79.2012.6291187
