• DocumentCode
    3193829
  • Title

    Time-domain interleaved high sampling rate system for large signal characterization of non-linear devices

  • Author

    Ahmed, S. ; Neveux, G. ; Reveyrand, T. ; Barataud, D. ; Nebus, J.M.

  • Author_Institution
    XLIM, Univ. of Limoges, Limoges, France
  • fYear
    2012
  • fDate
    22-22 June 2012
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This paper proposes a high sampling rate, 4-channel Track and Hold Amplifier based time-domain measurement setup. It achieves an equivalent high sampling rate using Coherent Time Interleaved Sampling (CTIS) technique to accurately characterize high Power amplifiers driven by repetitive pulsed RF large signal. The acquired samples are the combination of non-sequential sub-sampling technique and the measurement system based on the use of Track and Hold amplifiers to avoid Intermediate Frequency (IF) aliasing and IF filtering. This principle is applied to the large signal pulsed characterization of S-band 50 W GaN amplifier. Fully calibrated acquired time-domain waveforms and power characteristics under varying load conditions are presented. To the authors knowledge the transients at the beginning and end of pulses are measured and exhibited for the first time.
  • Keywords
    III-V semiconductors; gallium compounds; power amplifiers; radiofrequency amplifiers; sample and hold circuits; signal sampling; time-domain analysis; wide band gap semiconductors; 4-channel track and hold amplifier; CTIS technique; GaN; IF aliasing; IF filtering; S-band amplifier; calibration; coherent time interleaved sampling technique; high power amplifier; intermediate frequency aliasing; large signal characterization; measurement system; nonlinear device; nonsequential subsampling technique; power 50 W; repetitive pulsed RF large signal; sample acquisition; time-domain interleaved high sampling rate system; time-domain measurement setup; time-domain waveform; Pulse measurements; Radio frequency; Time domain analysis; Time frequency analysis; Transient analysis; Voltage measurement; Non-Linear devices; Time-domain measurements; Track and hold amplifier; virtual sampling Frequency;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Measurement Conference (ARFTG), 2012 79th ARFTG
  • Conference_Location
    Montreal, QC
  • Print_ISBN
    978-1-4673-1229-5
  • Electronic_ISBN
    978-1-4673-1230-1
  • Type

    conf

  • DOI
    10.1109/ARFTG79.2012.6291189
  • Filename
    6291189