DocumentCode
3193895
Title
ZnO/ZnO:Al window and contact layer for thin film solar cells: high rate deposition by simultaneous RF and DC magnetron sputtering
Author
Ellimer, K. ; Wendt, R. ; Cebulla, R.
Author_Institution
Dept. Solar Energetics, Hahn-Meitner-Inst., Berlin, Germany
fYear
1996
fDate
13-17 May 1996
Firstpage
881
Lastpage
884
Abstract
RF-magnetron sputtering of zinc oxide films (ZnO:Al and ZnO) is nearly exclusively used for the deposition of the window and contact layer for heterojunction thin film solar cells based on absorber materials like CuInSe2, CdTe or CulnS2. A drawback of this sputtering technique is the small deposition rate. This is caused by the low DC-voltage that develops at the target, since the sputtering rate in the energy range below 1 keV depends linearly on the acceleration voltage in the cathode fall. In order to increase the target voltage a simultaneous excitation by RF (13.56 MHz) and DC has been used. In this way, the advantages of both excitation modes have been combined for sputtering from oxidic targets (ZnO and ZnO:Al). Excitation by DC increases the deposition rate up to a factor of 1.5. On the other hand RF-excitation decreases the specific resistance significantly. This new deposition method has been used for the preparation of ZnO:Al/ZnO/CdS/CuInS2-solar cells
Keywords
II-VI semiconductors; aluminium; cadmium compounds; copper compounds; indium compounds; semiconductor device testing; semiconductor doping; semiconductor thin films; solar cells; sputter deposition; sputtered coatings; ternary semiconductors; zinc compounds; 13.56 MHz; ZnO:Al-ZnO-CdS-CuInS2; ZnO:Al/ZnO/CdS/CuInS2 solar cells; contact layer; deposition rate; oxidic targets; simultaneous RF/DC magnetron sputtering; specific resistance; sputtering technique; thin-film solar cells; window layer; Ceramics; Magnetic materials; Optical films; Optical pumping; Photovoltaic cells; Radio frequency; Sputtering; Substrates; Voltage; Zinc oxide;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference, 1996., Conference Record of the Twenty Fifth IEEE
Conference_Location
Washington, DC
ISSN
0160-8371
Print_ISBN
0-7803-3166-4
Type
conf
DOI
10.1109/PVSC.1996.564269
Filename
564269
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