Coaxial D-dot probe: design and testing

Author

Metwally, I.A.

Author_Institution

Dept. of Electr. Eng., Mansoura Univ., Egypt

fYear

1995

fDate

22-25 Oct 1995

Firstpage

298

Lastpage

301

Abstract

A new coaxial D-dot probe is designed and calibrated. A charge simulation programme is used to get the best configuration and arrangement of the probe design. The calibration is made against a conventional capacitive divider. The designed probe shows faster response and eliminates inductive overshoot to some extent. Coaxial D-dot probes are the ideal method for fast transient measurements; especially, for those tests which incorporate high energy such as for testing ZnO varistors, arresters, or arrester elements. Examples of such tests are also introduced

Keywords

arresters; impulse testing; probes; semiconductor device testing; transient analysis; transients; varistors; voltage measurement; SPICE simulation; ZnO varistor testing; arrester element testing; arrester testing; calibration; charge simulation programme; coaxial D-dot probe design; coaxial D-dot probe testing; equivalent circuit; fast transient measurements; field coupled sensors; high energy testing; impulse voltage measurement; inductive overshoot elimination; Arresters; Capacitance; Coaxial cables; Coaxial components; Energy measurement; Equivalent circuits; Integrated circuit measurements; Probes; Testing; Voltage measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical Insulation and Dielectric Phenomena, 1995. Annual Report., Conference on

Conference_Location

Virginia Beach, VA

Print_ISBN

0-7803-2931-7

Type

conf

DOI

10.1109/CEIDP.1995.483722

Filename

483722