Title :
Measurement of dielectric property distributions using interdigital dielectrometry sensors
Author :
Mamishev, Alexander ; Du, Yanqing ; Zahn, Markus
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., MIT, Cambridge, MA, USA
Abstract :
Estimation of physical properties of insulating materials may effectively be done by using nondestructive ω-k (frequency-wavelength) dielectrometry technology. Essential to this technology are pairs of interdigitated electrodes, which respond to the change in resistive and capacitive properties of the surrounding media. This paper presents both experimental and theoretical data, which helps to investigate the ability of the sensor to characterize multi-layered insulating and semi-insulating materials. Issues of precision and reliability of the measurements are discussed
Keywords :
dielectric measurement; electrometers; insulation testing; interdigital transducers; capacitive properties; dielectric property distributions; frequency-wavelength dielectrometry technology; insulating materials; interdigital dielectrometry sensors; interdigitated electrodes; measurement reliability; multi-layered materials; resistive properties; semi-insulating materials; Acoustic sensors; Admittance; Circuit testing; Dielectric materials; Dielectric measurements; Dielectrics and electrical insulation; Electrodes; Materials science and technology; Sensor phenomena and characterization; Voltage;
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 1995. Annual Report., Conference on
Conference_Location :
Virginia Beach, VA
Print_ISBN :
0-7803-2931-7
DOI :
10.1109/CEIDP.1995.483725
