• DocumentCode
    3194027
  • Title

    Improvements in cross ratio invariance techniques for coaxial probe dielectric measurements

  • Author

    Grady, Michael ; Wentworth, Stuart ; Weller, Thomas

  • Author_Institution
    Dept. of Electr. Eng., Univ. of South Florida, Tampa, FL, USA
  • fYear
    2012
  • fDate
    22-22 June 2012
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    In coaxial probe dielectric measurements the use of a cross ratio invariance of three dielectric reference materials and one material under test (MUT) has been a common approach to calibrate and thereafter extract the complex permittivity of a MUT. Although it is generally accepted that the cross ratio is most accurate when one uses at least one reference material that resembles the MUT, there has been relatively little discussion on how different combinations of reference materials affect the accuracy of the extracted data. This work will describe two new approaches for implementing the cross ratio invariance technique by (1) measuring more than three dielectric references and selecting the three that most closely resemble the MUT, or (2) by forming a cross ratio of five reference materials and one MUT. The two approaches are evaluated through simulation and measurement by exploring the error in the extracted properties of 20 independently measured dielectric materials. For both new methods, the percent error in the extracted complex permittivity typically reduces from approximately 0.5% to 0.25% or less compared to the standard approach.
  • Keywords
    calibration; dielectric materials; invariance; materials testing; permittivity measurement; MUT; calibration; coaxial probe dielectric measurement; complex permittivity extraction; cross ratio invariance technique; data extraction; dielectric material measurement; dielectric reference material; dielectric reference measurement; material under test; Accuracy; Materials; Permittivity; Permittivity measurement; Probes; Standards; Coaxial probe; calibration; cross ratio invariance; dielectric measurements;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Measurement Conference (ARFTG), 2012 79th ARFTG
  • Conference_Location
    Montreal, QC
  • Print_ISBN
    978-1-4673-1229-5
  • Electronic_ISBN
    978-1-4673-1230-1
  • Type

    conf

  • DOI
    10.1109/ARFTG79.2012.6291199
  • Filename
    6291199