Title :
Statistical modeling of the atrioventricular node during atrial fibrillation: Data length and estimator performance
Author :
Corino, Valentina D. A. ; Sandberg, Frida ; Mainardi, L.T. ; Sornmo, Leif
Author_Institution :
Dept. of Electron., Inf. & Bioeng., Politec. di Milano, Milan, Italy
Abstract :
The atrioventricular (AV) node plays a central role during atrial fibrillation (AF). We have recently proposed a statistical AV node model defined by parameters characterizing the arrival rate of atrial impulses, the probability of an impulse choosing either one of the dual AV nodal pathways, the refractory periods of the pathways, and the prolongation of refractory periods. All model parameters are estimated from the RR series using maximum likelihood (ML) estimation, except for the mean arrival rate of atrial impulses which is estimated by the AF frequency derived from the f-waves. The aim of this study is to present a unified approach to ML estimation which also involves the shorter refractory period, thus avoiding our previous Poincaré plot analysis which becomes biased. In addition, the number of RR intervals required for accurate parameter estimation is presented. The results show that the shorter refractory period can be accurately estimated, and that the resulting estimates converge to the true values when about 500 RR intervals are available.
Keywords :
bioelectric potentials; electrocardiography; maximum likelihood estimation; physiological models; time series; RR series interval; atrial fibrillation frequency; atrial impulse arrival rate; atrial impulse probability; atrioventricular node refractory period; data estimator performance; data length performance; f-wave; maximum likelihood estimation; parameter estimation; poincare plot analysis; statistical atrioventricular node model; Computational modeling; Data models; Decorrelation; Hidden Markov models; Maximum likelihood estimation; Parameter estimation;
Conference_Titel :
Engineering in Medicine and Biology Society (EMBC), 2013 35th Annual International Conference of the IEEE
Conference_Location :
Osaka
DOI :
10.1109/EMBC.2013.6610064