DocumentCode :
3194160
Title :
The influence of digital measurement system characteristics on PD patterns
Author :
Bozzo, R. ; Gemme, C. ; Guastavino, F.
Author_Institution :
Dipartimento di Ingegneria Elettrica, Genoa Univ., Italy
fYear :
1995
fDate :
22-25 Oct 1995
Firstpage :
347
Lastpage :
352
Abstract :
Digital systems to measure PDs have been widely adopted in the last years. Therefore the need of simple and effective methods to elaborate the large amount of available data, relevant to PD activity, arises. For example, it has already been shown that parameters resulting from statistical analysis of PD patterns can allow one to determine the nature of PD sites. Nevertheless the significance of the statistical parameters can be strongly affected by the measurement system characteristics and, in particular, by its adjustments. In the paper it is shown how the characteristics of the measurement system (amplifier gains, acquisition time lag, number of channels) can affect the PD patterns and relevant statistical parameters. For this purpose, two different experimental set-ups have been adopted, measuring PDs which act on the surface of polymeric films or inside tree channels. In this way, the acquired PDs were also relevant to different degradation levels of the PD site
Keywords :
data acquisition; insulation testing; organic insulating materials; partial discharges; polymer films; statistical analysis; PD patterns; acquisition time lag; amplifier gains; degradation levels; digital measurement system; polymeric films; statistical parameters; tree channels; Degradation; Digital systems; Electric variables measurement; Frequency; Histograms; Impedance; Partial discharge measurement; Partial discharges; Polymer films; Time measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 1995. Annual Report., Conference on
Conference_Location :
Virginia Beach, VA
Print_ISBN :
0-7803-2931-7
Type :
conf
DOI :
10.1109/CEIDP.1995.483735
Filename :
483735
Link To Document :
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