• DocumentCode
    3194321
  • Title

    Stacked chip-to-chip interconnections using wafer bonding technology with dielectric bonding glues

  • Author

    Lü, J.Q. ; Kwon, Y. ; Kraft, R.P. ; Gutmann, R.J. ; McDonald, J.F. ; Gale, T.S.

  • Author_Institution
    Focus Center, Rensselaer Polytech. Inst., Troy, NY, USA
  • fYear
    2001
  • fDate
    6-6 June 2001
  • Firstpage
    219
  • Lastpage
    221
  • Abstract
    Three-dimensional (3D) interconnects offer the potential of reducing fabrication and performance limitations of future generations of planar ICs. This paper describes a specific approach, incorporating wafer alignment and wafer bonding of two 200-mm silicon wafers, along with subsequent processing steps. Our approach using dielectrics as the bonding glue layer provides a monolithic 3D interconnect process, which is fully compatible with back-end-of-the-line processing. This 3D technology enables heterogeneous systems, such as future electronic and photonic systems using a mix-and-match hard IP core design approach, and provides a high-density pin-out alternative to stacked chip-scale packages today.
  • Keywords
    integrated circuit interconnections; wafer bonding; 200 mm; BEOL processing; Si; dielectric bonding glue; heterogeneous system; mix-and-match hard IP core design; monolithic three-dimensional interconnect; planar IC; stacked chip-to-chip interconnection; wafer alignment; wafer bonding; Chip scale packaging; Design methodology; Dielectrics; Electronics packaging; Fabrication; Gold; Integrated circuit interconnections; Large scale integration; System-on-a-chip; Wafer bonding;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Interconnect Technology Conference, 2001. Proceedings of the IEEE 2001 International
  • Conference_Location
    Burlingame, CA, USA
  • Print_ISBN
    0-7803-6678-6
  • Type

    conf

  • DOI
    10.1109/IITC.2001.930066
  • Filename
    930066