Title : 
Comparison of MB-OFDM and DS-UWB Interference
         
        
            Author : 
Nasri, A. ; Schober, R. ; Lampe, L.
         
        
            Author_Institution : 
Dept. of Electr. & Comput. Eng., British Columbia Univ., Vancouver, BC
         
        
        
        
        
        
            Abstract : 
In this paper, we compare the effects of multi-band orthogonal frequency-division multiplexing (MB-OFDM) and direct-sequence ultra-wideband (DS-UWB) interference on a narrowband (NB) signal. For this purpose, we first derive an analytical expression for the moment generating function (MGF) of DS-UWB interference. Based on this result we obtain an expression for the bit error rate (BER) of a binary phase-shift keying (BPSK) NB signal impaired by DS-UWB and additive white Gaussian noise which lends itself to efficient numerical evaluation. We show that for NB signal bandwidths much smaller than the DS-UWB bandwidth the NB system performance strongly depends on the carrier frequency offset between the NB signal and the DS-UWB signal and we derive corresponding BER approximations. Finally, we show that whether MB-OFDM or DS-UWB interference leads to less performance degradation strongly depends on the NB signal bandwidth
         
        
            Keywords : 
AWGN; OFDM modulation; approximation theory; error statistics; interference (signal); phase shift keying; ultra wideband communication; AWGN; BPSK; DS-UWB; MB-OFDM; MGF; additive white Gaussian noise; approximation theory; binary phase-shift keying; direct-sequence ultra wideband interference; error statistics; moment generating function; multi band orthogonal frequency-division multiplexing; Additive white noise; Bandwidth; Binary phase shift keying; Bit error rate; Frequency division multiplexing; Interference; Narrowband; Niobium; Phase shift keying; Ultra wideband technology;
         
        
        
        
            Conference_Titel : 
Ultra-Wideband, The 2006 IEEE 2006 International Conference on
         
        
            Conference_Location : 
Waltham, MA
         
        
            Print_ISBN : 
1-4244-0101-1
         
        
            Electronic_ISBN : 
1-4244-0102-X
         
        
        
            DOI : 
10.1109/ICU.2006.281598