Title :
An Efficient All-Digital Phase-Locked Loop with Input Fault Detection
Author :
Yau, Tin-Yam ; Caohuu, Tri ; Kim, Jeonghee
Author_Institution :
Dept. of Electr. Eng., San Jose State Univ., San Jose, CA, USA
Abstract :
An all-digital phase-locked loop (ADPLL) having a fault detection of the input reference signal was modeled in Verilog hardware descriptive language (HDL) and is presented in this paper. The design can track an input signal with frequency ranging from 61kHz to 43MHz in a maximum locked-in time of five reference cycles. In the case of loss of input reference, it can continue to generate an output signal with the previously stored parameters and report the anomaly as status. The functional and timing requirements of the design were verified using Synopsys electronic design automation (EDA) tools. The ADPLL can be utilized as an intellectual property (IP) core to reduce the development time of an application-specified integrated circuit (ASIC) product. The input fault monitoring capability can provide operational feedback that improves the overall system reliability.
Keywords :
application specific integrated circuits; hardware description languages; industrial property; integrated circuit reliability; logic design; phase locked loops; ASIC; Synopsys electronic design automation; Verilog; all-digital phase-locked loop; application-specified integrated circuit; frequency 61 kHz to 43 MHz; hardware descriptive language; input fault monitoring; input reference signal fault detection; intellectual property core; system reliability; Clocks; Fault detection; Frequency conversion; Hardware design languages; Phase frequency detector; Radiation detectors; Timing;
Conference_Titel :
Information Science and Applications (ICISA), 2011 International Conference on
Conference_Location :
Jeju Island
Print_ISBN :
978-1-4244-9222-0
Electronic_ISBN :
978-1-4244-9223-7
DOI :
10.1109/ICISA.2011.5772394