Title :
Measuring the scattering parameters of microwave devices
Author :
de Oliveira, Antonio Jeronimo Belfort
Author_Institution :
Centro de Tecnologia, Univ. Fed. de Pernambuco, Recife, Brazil
Abstract :
A complete six-port network analyser is proposed that makes use of a single reflectometer. The proposed configuration employes a precision attenuator which dispenses with connections and disconnections with calibration standards, needs no inversion of the two-port device under test for measuring the transmission parameters and as its main feature, avoids the use of switches which are always present in the traditional configurations described in the literature. Its calibration and measurement procedures are also described
Keywords :
S-parameters; calibration; microwave devices; microwave reflectometry; network analysers; calibration; measurement procedures; microwave devices; precision attenuator; scattering parameters; single reflectometer; six-port network analyser; Attenuators; Calibration; Costs; Electronic mail; Frequency; Microwave devices; Microwave measurements; Scattering parameters; Switches; Testing;
Conference_Titel :
Microwave and Optoelectronics Conference, 1997. Linking to the Next Century. Proceedings., 1997 SBMO/IEEE MTT-S International
Conference_Location :
Natal
Print_ISBN :
0-7803-4165-1
DOI :
10.1109/SBMOMO.1997.646899
