Title :
Study on False Alarm of the Armored Vehicles Electrical System BIT
Author :
Cheng, Yanwei ; Li, Guangsheng ; Xie, Yongcheng
Author_Institution :
Acad. of Armored Force Eng., Beijing, China
Abstract :
In the Armored Vechiles Electrical System BIT, transient and intermittent faults are the important causes of false alarm. Setting up false alarm probability model of the four states system, which is compared with two states model, the study shows that recognising transient and intermittent faults can reducing false alarm rate of system BIT effectively.
Keywords :
armour; built-in self test; military vehicles; armored vehicles electrical system BIT; built-in test technology; false alarm probability model; intermittent fault; transient fault; Aerospace testing; Circuit faults; Electric vehicles; Electrical fault detection; Machine intelligence; Power supplies; Power system faults; Power system modeling; Power system transients; System testing; BIT; Electrical system; False Alarm Rate;
Conference_Titel :
Intelligent Computation Technology and Automation (ICICTA), 2010 International Conference on
Conference_Location :
Changsha
Print_ISBN :
978-1-4244-7279-6
Electronic_ISBN :
978-1-4244-7280-2
DOI :
10.1109/ICICTA.2010.100
