• DocumentCode
    3194884
  • Title

    Numerical modelling of AC-characteristics of CdTe and CIS solar cells

  • Author

    Niemegeers, Alex ; Burgelman, Marc

  • Author_Institution
    Dept. of Electron. & Inf. Syst., Univ. of Gent, Belgium
  • fYear
    1996
  • fDate
    13-17 May 1996
  • Firstpage
    901
  • Lastpage
    904
  • Abstract
    A complete electrical characterisation of thin-film solar cells necessitates the analysis of capacitance vs. voltage measurements at different frequencies and illumination intensities. The authors developed a fully numerical device simulation tool for polycrystalline CdTe and CuInSe2 solar cells, which carries out frequency-domain calculations. Numerical simulations of I-V and C-V characteristics of CdTe cells are compared with measurements. It is shown that capacitance-voltage measurements not only confirm the thesis that a back contact barrier limits the current at high forward bias-they also yield additional information on the CdTe doping in the vicinity of the contact. The numerical model has also been applied to CuInSe2 . The authors indicate that especially the doping profiles which are deduced from C-V data may be misinterpreted when interface states are present at the heterojunction
  • Keywords
    II-VI semiconductors; cadmium compounds; copper compounds; doping profiles; indium compounds; numerical analysis; semiconductor device models; semiconductor doping; semiconductor thin films; solar cells; ternary semiconductors; C-V characteristics; CdTe; CdTe solar cells; CuInSe2; CuInSe2 solar cells; I-V characteristics; doping profiles; electrical characterisation; frequency-domain calculations; heterojunction; numerical device simulation; thin film semiconductors; Capacitance; Capacitance-voltage characteristics; Computational Intelligence Society; Frequency; Lighting; Numerical models; Numerical simulation; Photovoltaic cells; Transistors; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 1996., Conference Record of the Twenty Fifth IEEE
  • Conference_Location
    Washington, DC
  • ISSN
    0160-8371
  • Print_ISBN
    0-7803-3166-4
  • Type

    conf

  • DOI
    10.1109/PVSC.1996.564274
  • Filename
    564274