DocumentCode :
3194884
Title :
Numerical modelling of AC-characteristics of CdTe and CIS solar cells
Author :
Niemegeers, Alex ; Burgelman, Marc
Author_Institution :
Dept. of Electron. & Inf. Syst., Univ. of Gent, Belgium
fYear :
1996
fDate :
13-17 May 1996
Firstpage :
901
Lastpage :
904
Abstract :
A complete electrical characterisation of thin-film solar cells necessitates the analysis of capacitance vs. voltage measurements at different frequencies and illumination intensities. The authors developed a fully numerical device simulation tool for polycrystalline CdTe and CuInSe2 solar cells, which carries out frequency-domain calculations. Numerical simulations of I-V and C-V characteristics of CdTe cells are compared with measurements. It is shown that capacitance-voltage measurements not only confirm the thesis that a back contact barrier limits the current at high forward bias-they also yield additional information on the CdTe doping in the vicinity of the contact. The numerical model has also been applied to CuInSe2 . The authors indicate that especially the doping profiles which are deduced from C-V data may be misinterpreted when interface states are present at the heterojunction
Keywords :
II-VI semiconductors; cadmium compounds; copper compounds; doping profiles; indium compounds; numerical analysis; semiconductor device models; semiconductor doping; semiconductor thin films; solar cells; ternary semiconductors; C-V characteristics; CdTe; CdTe solar cells; CuInSe2; CuInSe2 solar cells; I-V characteristics; doping profiles; electrical characterisation; frequency-domain calculations; heterojunction; numerical device simulation; thin film semiconductors; Capacitance; Capacitance-voltage characteristics; Computational Intelligence Society; Frequency; Lighting; Numerical models; Numerical simulation; Photovoltaic cells; Transistors; Voltage measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference, 1996., Conference Record of the Twenty Fifth IEEE
Conference_Location :
Washington, DC
ISSN :
0160-8371
Print_ISBN :
0-7803-3166-4
Type :
conf
DOI :
10.1109/PVSC.1996.564274
Filename :
564274
Link To Document :
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