• DocumentCode
    3195044
  • Title

    A fast approach for edge preserving super-resolution

  • Author

    Upla, Kishor P. ; Gajjar, Prakash P. ; Joshi, Manjunath V. ; Banerjee, Asim ; Singh, Vineet

  • Author_Institution
    Dhirubhai Ambani - Institute of Information and Communication Technology, Gandhinagar, India
  • fYear
    2011
  • fDate
    11-15 July 2011
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    In this paper we propose a fast approach for edge preserving super-resolution (SR) based on learning of contourlet coefficients. Given a low resolution test image, we first obtain an initial HR estimate i.e., a close approximation to SR image by learning the contourlet coefficients from a training database consisting of low resolution (LR) and high resolution (HR) images. The final SR image is obtained by using a regularization framework in which both the SR and the LR images are modeled as separate homogeneous Markov Random Fields (MRFs). The LR image formation process is modeled as a decimated and noisy version of the SR image and the final cost function is minimized by using a gradient descent method. Novelty of our approach lies in preserving the edges in the final SR image while using a non edge preserving MRF prior. This is definitely advantageous since it avoids the use of discontinuity preserving prior and hence the computationally taxing optimization methods. The edges in the final SR correspond to those learned from the initial HR estimate. The use of MRF on the low resolution image imposes an additional constraint on the final solution and hence we expect a better solution. In addition, we use the initial HR image for estimating the decimation matrix entries as well as for learning the corresponding MRF parameter. We show the effectiveness of the proposed approach by conducting the experiments on images captured using a real camera.
  • Keywords
    Contourlet; MRF; canny edge; gradient descent;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Multimedia and Expo (ICME), 2011 IEEE International Conference on
  • Conference_Location
    Barcelona, Spain
  • ISSN
    1945-7871
  • Print_ISBN
    978-1-61284-348-3
  • Electronic_ISBN
    1945-7871
  • Type

    conf

  • DOI
    10.1109/ICME.2011.6011945
  • Filename
    6011945