Title :
Research on a fast edge generation technology of the digital pulse
Author :
Zaiming, Fu ; Yibing, Shi
Author_Institution :
Sch. of Automaton Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu
Abstract :
This paper advances a fast edge generation technology for digital pulse based on the dynamic characteristic of the step recovery diode (SRD). The raise edge of digital pulse is adjusted within 150 ps with 1.7 V amplitude by a short transition time of the SRD. Besides, the duty cycle can be regulated partially using long storage time of the SRD. The paper discussed the principle and the idea of the design. The structure and the test result of the circuit are given in the paper.
Keywords :
charge storage diodes; circuit testing; network synthesis; digital pulse; fast edge generation technology; step recovery diode; Automata; Circuit testing; Impedance; Paper technology; Pulse amplifiers; Pulse circuits; Pulse generation; Pulse measurements; Signal generators; Voltage;
Conference_Titel :
Communications, Circuits and Systems, 2008. ICCCAS 2008. International Conference on
Conference_Location :
Fujian
Print_ISBN :
978-1-4244-2063-6
Electronic_ISBN :
978-1-4244-2064-3
DOI :
10.1109/ICCCAS.2008.4657952
