DocumentCode
3195310
Title
Research on a fast edge generation technology of the digital pulse
Author
Zaiming, Fu ; Yibing, Shi
Author_Institution
Sch. of Automaton Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu
fYear
2008
fDate
25-27 May 2008
Firstpage
1066
Lastpage
1069
Abstract
This paper advances a fast edge generation technology for digital pulse based on the dynamic characteristic of the step recovery diode (SRD). The raise edge of digital pulse is adjusted within 150 ps with 1.7 V amplitude by a short transition time of the SRD. Besides, the duty cycle can be regulated partially using long storage time of the SRD. The paper discussed the principle and the idea of the design. The structure and the test result of the circuit are given in the paper.
Keywords
charge storage diodes; circuit testing; network synthesis; digital pulse; fast edge generation technology; step recovery diode; Automata; Circuit testing; Impedance; Paper technology; Pulse amplifiers; Pulse circuits; Pulse generation; Pulse measurements; Signal generators; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Communications, Circuits and Systems, 2008. ICCCAS 2008. International Conference on
Conference_Location
Fujian
Print_ISBN
978-1-4244-2063-6
Electronic_ISBN
978-1-4244-2064-3
Type
conf
DOI
10.1109/ICCCAS.2008.4657952
Filename
4657952
Link To Document