DocumentCode :
3195438
Title :
High Coverage Power Integrity Verification in PSO Domains Employing Distributed PSO Switches
Author :
Sofer, Sergey ; Berkovitz, Asher ; Neiman, Valery
Author_Institution :
Freescale Semicond. Israel Ltd., Herzelia, Israel
fYear :
2011
fDate :
5-7 Dec. 2011
Firstpage :
60
Lastpage :
64
Abstract :
Proposed a way to increase the coverage of power distribution network verification, especially applicable for designs, employing distributed power gating switches. It includes defining of amount of CMOS devices (in the same cluster) simultaneously toggling at the same place and following voltage droop analysis of whether amount of devices, belonging to the same cluster, toggle above the predefined threshold, all over the functional pattern(s). Additionally, we define clear guidelines to the implementation tools how constantly toggling CMOS devices like clock buffers, are expected to be placed in order to avoid PDN failures. Some examples of the proposed approach are provided.
Keywords :
CMOS integrated circuits; integrated circuit design; power supply circuits; semiconductor switches; CMOS device; PSO domain; clock buffer; distributed PSO switches; distributed power gating switch; high coverage power integrity verification; power distribution network verification; power shut-off; voltage droop analysis; Clocks; Logic gates; Power demand; Switches; System-on-a-chip; Vectors; PSO; Power Distribution Network; Power Gating; Power Integrity; Voltage Droop;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microprocessor Test and Verification (MTV), 2011 12th International Workshop on
Conference_Location :
Austin, TX
ISSN :
1550-4093
Print_ISBN :
978-1-4577-2101-4
Type :
conf
DOI :
10.1109/MTV.2011.21
Filename :
6142345
Link To Document :
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