DocumentCode :
3195649
Title :
Single-trial detection of visual evoked potentials by common spatial patterns and wavelet filtering for brain-computer interface
Author :
Yiheng Tu ; Gan Huang ; Yeung Sam Hung ; Li Hu ; Yong Hu ; Zhiguo Zhang
Author_Institution :
Dept. of Electr. & Electron. Eng., Univ. of Hong Kong, Hong Kong, China
fYear :
2013
fDate :
3-7 July 2013
Firstpage :
2882
Lastpage :
2885
Abstract :
Event-related potentials (ERPs) are widely used in brain-computer interface (BCI) systems as input signals conveying a subject´s intention. A fast and reliable single-trial ERP detection method can be used to develop a BCI system with both high speed and high accuracy. However, most of single-trial ERP detection methods are developed for offline EEG analysis and thus have a high computational complexity and need manual operations. Therefore, they are not applicable to practical BCI systems, which require a low-complexity and automatic ERP detection method. This work presents a joint spatial-time-frequency filter that combines common spatial patterns (CSP) and wavelet filtering (WF) for improving the signal-to-noise (SNR) of visual evoked potentials (VEP), which can lead to a single-trial ERP-based BCI.
Keywords :
brain-computer interfaces; electroencephalography; medical signal detection; spatial filters; time-frequency analysis; visual evoked potentials; wavelet transforms; BCI system; CSP; WF; brain-computer interface system; common spatial pattern; event-related potential; high computational complexity; input signal; joint spatial-time-frequency filter; low-complexity-automatic ERP detection method; offline EEG analysis; signal-to-noise; single-trial ERP detection method; single-trial ERP-based BCI; subject intention; visual evoked potential; wavelet filtering; Accuracy; Continuous wavelet transforms; Electroencephalography; Filtering; Signal to noise ratio; Time-frequency analysis; Visualization;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society (EMBC), 2013 35th Annual International Conference of the IEEE
Conference_Location :
Osaka
ISSN :
1557-170X
Type :
conf
DOI :
10.1109/EMBC.2013.6610142
Filename :
6610142
Link To Document :
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