Reconstruction of two-dimensional distribution function of defects in dielectrics based on TSD data

Author

Gorokhovatsky, A.U. ; Grigoriev, V.L. ; Gubanski, Stanislaw

Author_Institution

Herzen State Pedagogical Univ. of Russia, St. Petersburg, Russia

fYear

1995

fDate

22-25 Oct 1995

Firstpage

662

Lastpage

663

Abstract

Thermally stimulated current spectroscopy (TSCS) due to its simplicity and informativity plays the leading role among the investigation methods of electrically active defects (EADs) in high-resistance materials. In the case of disordered dielectrics, the EADs are characterized by a two-dimensional distribution function of relaxators G(W,ω), where W is the activation energy and ω is the frequency factor. In this paper a hybrid numerical method is proposed for defining G(W,ω) from the experimentally derived TSD current dependence on temperature

Keywords

dielectric measurement; thermally stimulated currents; TSD; activation energy; disordered dielectrics; electrically active defects; frequency factor; hybrid numerical method; regularization; relaxators; thermally stimulated current spectroscopy; two-dimensional distribution function; Current measurement; Dielectrics; Distribution functions; Frequency; Heating; Particle measurements; Stability; Temperature dependence; Temperature distribution; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical Insulation and Dielectric Phenomena, 1995. Annual Report., Conference on

Conference_Location

Virginia Beach, VA

Print_ISBN

0-7803-2931-7

Type

conf

DOI

10.1109/CEIDP.1995.483812

Filename

483812