An apprach to analong and mixed-signal BIST based-on pseudorandom testing

In this paper, we propose a new BIST method for analog and mixed-signal circuits test based on pseudorandom testing. Firstly we use pseudo-random sequence as testing stimulus, and we can obtain K-dimensional signature space by calculating the cross-correlation function of input and output sequences. Secondly, we can analyze and diagnosis the circuits under test (CUT) by signatures in the signature space, not in the performance space. The major advantages of this new scheme are: 1) a universal input stimulus (pseudorandom sequence) is used and thus test generation can be avoided, and 2) signatures for high quality testing can be easily constructed and thus testing cost can be minimized.