Title :
A new method for IDDT test of CMOS circuits
Author :
Nie, Maowen ; Xu, Hongbing ; Zhang, Jian
Author_Institution :
Sch. of Autom. Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu
Abstract :
Wavelet analysis attracts much attention because of its effectiveness in signal process. As applications of wavelet analysis, wavelet packets and wavelet neural networks have been used for effectively exacting information in fault diagnosis. This paper presents a new method for exacting information from IDDT (transient power supply current) and performing fault diagnosis. This method is based on singularity, Lipschitz exponents and multi-resolution analysis. Though it is easy and simple to implement, it is efficient. Experimental results for the compensated CMOS operational amplifier benchmark circuit show that it is effective for detecting and locating bridging faults and stuck-open-faults.
Keywords :
CMOS integrated circuits; fault diagnosis; operational amplifiers; wavelet transforms; CMOS circuits; CMOS operational amplifier; bridging faults; fault diagnosis; stuck-open-faults; transient power supply current; wavelet analysis; wavelet neural networks; wavelet packets; Circuit analysis; Circuit testing; Current supplies; Fault diagnosis; Information analysis; Neural networks; Signal analysis; Signal processing; Wavelet analysis; Wavelet packets;
Conference_Titel :
Communications, Circuits and Systems, 2008. ICCCAS 2008. International Conference on
Conference_Location :
Fujian
Print_ISBN :
978-1-4244-2063-6
Electronic_ISBN :
978-1-4244-2064-3
DOI :
10.1109/ICCCAS.2008.4657982
