A new method for IDDT test of CMOS circuits

Author

Nie, Maowen ; Xu, Hongbing ; Zhang, Jian

Author_Institution

Sch. of Autom. Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu

fYear

2008

fDate

25-27 May 2008

Firstpage

1200

Lastpage

1203

Abstract

Wavelet analysis attracts much attention because of its effectiveness in signal process. As applications of wavelet analysis, wavelet packets and wavelet neural networks have been used for effectively exacting information in fault diagnosis. This paper presents a new method for exacting information from IDDT (transient power supply current) and performing fault diagnosis. This method is based on singularity, Lipschitz exponents and multi-resolution analysis. Though it is easy and simple to implement, it is efficient. Experimental results for the compensated CMOS operational amplifier benchmark circuit show that it is effective for detecting and locating bridging faults and stuck-open-faults.

Keywords

CMOS integrated circuits; fault diagnosis; operational amplifiers; wavelet transforms; CMOS circuits; CMOS operational amplifier; bridging faults; fault diagnosis; stuck-open-faults; transient power supply current; wavelet analysis; wavelet neural networks; wavelet packets; Circuit analysis; Circuit testing; Current supplies; Fault diagnosis; Information analysis; Neural networks; Signal analysis; Signal processing; Wavelet analysis; Wavelet packets;

fLanguage

English

Publisher

ieee

Conference_Titel

Communications, Circuits and Systems, 2008. ICCCAS 2008. International Conference on

Conference_Location

Fujian

Print_ISBN

978-1-4244-2063-6

Electronic_ISBN

978-1-4244-2064-3

Type

conf

DOI

10.1109/ICCCAS.2008.4657982

Filename

4657982