Title :
A novel clock-fault detection and self-recovery circuit based on time-to-voltage converter
Author :
Hui, Hong ; Changhong, Yu ; Keming, Chen ; Lingling, Sun
Author_Institution :
Inst. of Microelectron. CAD, Hangzhou Dianzi Univ., Hangzhou
Abstract :
A novel clock-fault detection and self-recovery circuit is proposed to remedy against the effects of clock abnormality and irregularity. The clock self-recovery circuit is based on the principle of the time-to-voltage converter and the whole structure is very simple in contrast with the general clock recovery structure methodology. This circuit also can save the chip area and has the features of frequency auto-adaptability and clock deletion recovery. The simulation shows that the circuit is power efficient and very suitable for integration to realize the clock self-recovery, and the maximal frequency of clock self-recovery is 350 MHz.
Keywords :
clocks; clock deletion recovery; clock recovery structure methodology; clock self-recovery circuit; clock-fault detection; frequency 350 MHz; frequency auto-adaptability; time-to-voltage converter; CMOS technology; Circuits; Clocks; Crosstalk; Error correction; Frequency; Jitter; Nanoscale devices; Phase locked loops; Voltage;
Conference_Titel :
Communications, Circuits and Systems, 2008. ICCCAS 2008. International Conference on
Conference_Location :
Fujian
Print_ISBN :
978-1-4244-2063-6
Electronic_ISBN :
978-1-4244-2064-3
DOI :
10.1109/ICCCAS.2008.4657983