DocumentCode :
3196214
Title :
Characterisation of silver particles used for the Low Temperature Joining Technology
Author :
Früh, Christiane ; Günther, Michael ; Rittner, Martin ; Fix, Andreas ; Nowottnick, Mathias
fYear :
2010
fDate :
13-16 Sept. 2010
Firstpage :
1
Lastpage :
5
Abstract :
The Low Temperature Joining Technology (LTJT) is an important alternative to lead containing solders. Therefore the basic material, silver powders have been investigated. The particle morphology, the amount and composition of their organic coating and chemical impurities have been analysed. Scanning Electron Microscopy (SEM) has been used to determine the morphology of the silver particles. Differential Scanning Calorimetry (DSC) in combination with Thermogravimetry (TG) and Mass Spectroscopy (MS) reveals the occurrence of exothermic or endothermic reactions as well as information concerning mass loss and formed molecules. To determine the components of the organic coating Time of Flight - Secondary Ion Mass Spectroscopy (ToF-SIMS) has been applied. Inductively Coupled Plasma Optical Emission Spectrometry (ICP-OES) has been utilised to analyse chemical impurities. To remain a linkage between the characterised silver particles and the quality of a manufactured sintered joint, a shear test has been executed. One of the investigated powders reaches an averaged shear force of approximately 230 N. The mixture of small flake shaped and more spherical particles generates good adhesive strength.
Keywords :
adhesion; chemical reactions; differential scanning calorimetry; impurities; joining materials; joining processes; mechanical testing; powders; scanning electron microscopy; secondary ion mass spectra; silver; sintering; time of flight mass spectra; DSC; ICP-OES; SEM; ToF-SIMS; adhesive strength; chemical impurities; differential scanning calorimetry; endothermic reaction; exothermic reaction; inductively coupled plasma optical emission spectrometry; low temperature joining technology; mass loss; organic coating; particle morphology; scanning electron microscopy; shear test; silver particles; silver powders; sintered joint; thermogravimetry; time of flight-secondary ion mass spectroscopy; Impurities; Powders;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic System-Integration Technology Conference (ESTC), 2010 3rd
Conference_Location :
Berlin
Print_ISBN :
978-1-4244-8553-6
Electronic_ISBN :
978-1-4244-8554-3
Type :
conf
DOI :
10.1109/ESTC.2010.5642806
Filename :
5642806
Link To Document :
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