Title :
Automated nondestroying roughness control on optical ferrule surfaces
Author :
Nevlyudov, I.Sh. ; Tokarev, V.V. ; Tsimbal, A.M.
Author_Institution :
Kharkov State Tech. Univ. of Radio Electron., Ukraine
Abstract :
In the developed automated quality control system for end face of optical ferrules, a Linnik interferometer scheme, and a CCD coordinate-sensitive photo-receiver are used. There is need to fulfill the following basic requirement in an optical micro-interferometer scheme: the intensity of light flux from standard mirror is approximately equal to light flux intensity from surface of object, because that condition is necessary for interference traces observation. The MII-4 micro-interferometer is intended for end face roughness with greater coefficient of reflection (e.g. metal surfaces)
Keywords :
CCD image sensors; light interferometers; mirrors; optical elements; optical testing; quality control; reflectivity; surface topography measurement; CCD coordinate-sensitive photo-receiver; Linnik interferometer scheme; MII-4 micro-interferometer; automated NDT roughness control; automated quality control system; coefficient of reflection; end face roughness measurement; interference traces observation; light flux intensity; metal surfaces; optical ferrule end face fabrication; optical ferrule surfaces; optical micro-interferometer scheme; Automatic control; Charge coupled devices; Interference; Mirrors; Optical control; Optical interferometry; Optical reflection; Quality control; Rough surfaces; Surface roughness;
Conference_Titel :
Laser and Fiber-Optical Networks Modeling, 2001. Proceedings of LFNM 2001. 3rd International Workshop on
Conference_Location :
Kharkiv
Print_ISBN :
0-7803-6680-8
DOI :
10.1109/LFNM.2001.930209
