DocumentCode
3196787
Title
A novel vapor pressure transfusion model for the popcorning analysis of Quad Flat No-lead (QFN) packages
Author
Zhang, Minshu ; Lee, Shi-Wei Ricky
Author_Institution
Dept. of Mech. Eng., Hong Kong Univ. of Sci. & Technol., Kowloon, China
fYear
2010
fDate
13-16 Sept. 2010
Firstpage
1
Lastpage
9
Abstract
Vapor pressure is caused by moisture vaporizing during the reflow heating process. Most existing models evaluate vapor pressure based on moisture diffusion in solids by adopting Fick´s law. Differing from the traditional ones, a novel vapor pressure transfusion model is proposed in this paper with the consideration of moisture transfusion from the encapsulation molding compound into the crack opening zone. Quad Flat No-lead package is employed for demonstration. Based on certain assumptions that can be justified through physical conditions, a simple 1-D moisture transport model is established and a “moisture convection coefficient” is defined. With the “moisture convection” boundary condition, the analytical solution can be derived. In addition to simulation, an experimental study on the same type of package is also performed for model validation. Compared to the experiment results, it is found that the strain energy release rate calculated with the current novel vapor pressure model is more reasonable than those with traditional models. Several key features of the comparison between novel and traditional models are discussed in this paper.
Keywords
encapsulation; integrated circuit packaging; vapour pressure; 1D moisture transport model; Fick law; QFN packages; crack opening zone; encapsulation molding compound; moisture convection coefficient; moisture diffusion; moisture vaporization; popcorning analysis; quad flat no-lead packages; reflow heating process; strain energy release rate; vapor pressure transfusion model; Heating; Lead;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic System-Integration Technology Conference (ESTC), 2010 3rd
Conference_Location
Berlin
Print_ISBN
978-1-4244-8553-6
Electronic_ISBN
978-1-4244-8554-3
Type
conf
DOI
10.1109/ESTC.2010.5642835
Filename
5642835
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