Title :
Diffraction by a two-part planar material junction-oblique incidence
Author :
Ly, H.C. ; Rojas, R.G. ; Pathak, P.H.
Author_Institution :
ElectroSci. Lab., Ohio State Univ., Columbus, OH, USA
Abstract :
A uniform asymptotic solution to the problem of high-frequency diffraction by a planar junction of two thin material half-planes for the case of oblique incidence is developed. The generalized impedance boundary condition of O(t) has been employed to approximately characterize the electrically thin material slabs. The analysis is based on the Wiener-Hopf technique, where the factorization and decomposition of certain functions are expressed in relatively simple forms. The uniqueness of the solution is obtained by the determination of an additional junction condition from an approximated quasi-static analysis. The present analysis does not enforce reciprocity a priori yet obtains unique solutions which automatically satisfy reciprocity.<>
Keywords :
electromagnetic wave diffraction; Wiener-Hopf technique; approximated quasistatic analysis; decomposition; electrically thin material slabs; factorization; generalized impedance boundary condition; high-frequency diffraction; planar material junction-oblique incidence; thin material half-planes; uniform asymptotic solution; Boundary conditions; Conducting materials; Dielectrics; Diffraction; Electromagnetic scattering; Equations; Fourier transforms; Impedance; Polarization; Slabs;
Conference_Titel :
Antennas and Propagation Society International Symposium, 1992. AP-S. 1992 Digest. Held in Conjuction with: URSI Radio Science Meeting and Nuclear EMP Meeting., IEEE
Conference_Location :
Chicago, IL, USA
Print_ISBN :
0-7803-0730-5
DOI :
10.1109/APS.1992.221793