Title :
Analog to digital and digital to analog conversion based on stochastic logic
Author :
Ortega, J.G. ; Janer, C.L. ; Quero, J.M. ; Franquelo, L.G. ; Pinilla, J. ; Serrano, J.
Author_Institution :
Seville Univ., Spain
Abstract :
Digital to analog and analog to digital conversions can be realized in VLSI integrated circuits using a strictly digital technology and some additional analog circuits outside the IC. These techniques are based on the generation of a pulse sequence that represents a digital number. The mean value of this pulse sequence is obtained at the output of a low-pass external filter. The authors propose the use a stochastic pulse sequence instead of a traditional PWM signal. This technique has important advantages. Stochastic pulse sequences can be mathematically processed by extremely simple circuits. The product and addition of stochastic pulses can be evaluated by AND gates. The spectral properties of stochastic pulse sequences lead to less restrictive conditions to be imposed to the filter that makes the analog conversion of the pulse sequence. The authors have used this technique to implement digital to analog and analog to digital conversion in an integrated circuit that is currently being designed for a Spanish company
Keywords :
VLSI; analogue-digital conversion; digital-analogue conversion; integrated circuit technology; logic gates; low-pass filters; probabilistic logic; AND gates; VLSI integrated circuits; analog to digital conversion; digital number; digital to analog conversion; low-pass external filter; mathematical processing; pulse sequence generation; spectral properties; stochastic logic; Analog integrated circuits; Analog-digital conversion; Digital integrated circuits; Digital-analog conversion; Filters; Pulse circuits; Pulse width modulation; Space vector pulse width modulation; Stochastic processes; Very large scale integration;
Conference_Titel :
Industrial Electronics, Control, and Instrumentation, 1995., Proceedings of the 1995 IEEE IECON 21st International Conference on
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-3026-9
DOI :
10.1109/IECON.1995.483865