Title :
Micro bench for optical pulse picking from 4 GHz pulse trains generated by mode locking of DBR lasers
Author :
Klehr, A. ; Liero, A. ; Hoffmann, Th ; Schulz, J. ; Schwertfeger, S. ; Wenzel, H. ; Erbert, G. ; Heinrich, W. ; Tränkle, G.
Author_Institution :
Inst. fur Hochstfrequenztechnik, Leibniz-Inst. fur Hochstfrequenztechnik im Forschungsverbund Berlin e.V., Berlin, Germany
Abstract :
A new compact picosecond light source is presented. It consists of a master oscillator, an ultra fast pulse picker element and integrated high-frequency electronics arranged on a micro bench with a footprint of 5 cm × 4 cm. The master oscillator is a laser consisting of 200 μm long saturable absorber, 1500 μm long gain, 8000 μm long cavity, 200 μm long DBR and 100 μm long monitor sections. Pulses with a width of 10 ps and a peak power of 0.5 W are generated by hybrid mode locking. Despite the 1 cm long cavity, the repetition rate is still 4.3 GHz. The semiconductor pulse picking element is based on a ridge waveguide acting as an optical gate and a tapered gain section for pulse amplification. The light source emits pulses with with a peak power of more than 30 W pulse peak power and allows a free choice of the repetition rate in the range between 1 kHz and 100 MHz.
Keywords :
distributed Bragg reflector lasers; high-speed optical techniques; integrated optoelectronics; laser cavity resonators; laser mode locking; light sources; micro-optics; optical pulse generation; optical saturable absorption; oscillators; quantum well lasers; ridge waveguides; waveguide lasers; DBR lasers; compact picosecond light source; double quantum well; frequency 1 kHz to 100 MHz; frequency 4 GHz; hybrid mode locking; integrated high-frequency electronics; laser cavity; master oscillator; microbench; optical gate; optical pulse picking; pulse amplification; pulse train generation; pulse width; repetition rate; ridge waveguide; saturable absorber; size 200 mum; tapered gain section; ultrafast semiconductor pulse picking element; Cavity resonators; Gallium nitride; Monitoring; Shape measurement; Synthesizers;
Conference_Titel :
Electronic System-Integration Technology Conference (ESTC), 2010 3rd
Conference_Location :
Berlin
Print_ISBN :
978-1-4244-8553-6
Electronic_ISBN :
978-1-4244-8554-3
DOI :
10.1109/ESTC.2010.5642851
