DocumentCode
3197152
Title
A microscope system for characterization of mechanical properties of small-scaled objects
Author
Tohmyoh, H. ; Akanda, M.A.S. ; Saka, M.
Author_Institution
Dept. of Nanomech., Tohoku Univ., Sendai, Japan
fYear
2010
fDate
13-16 Sept. 2010
Firstpage
1
Lastpage
4
Abstract
A new microscopy system for characterization of mechanical properties of small-scaled objects is reported. A force sensor, piezo stage, manual manipulators, etc. are integrated in a single platform and these are combined with a high-resolution digital microscope to acquire the load-displacement relationships of the small-scaled objects together with the corresponding deformation pattern of the objects during testing. A small-span bending test of ultrathin Pt wire is demonstrated and the results are discussed.
Keywords
atomic force microscopy; bending; mechanical testing; nanowires; platinum; scanning electron microscopy; deformation pattern; digital microscope; small-scaled objects; small-span bending test; ultrathin platinum wire; Fitting; Force sensors; Loading; Microscopy; Testing; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic System-Integration Technology Conference (ESTC), 2010 3rd
Conference_Location
Berlin
Print_ISBN
978-1-4244-8553-6
Electronic_ISBN
978-1-4244-8554-3
Type
conf
DOI
10.1109/ESTC.2010.5642853
Filename
5642853
Link To Document