Atom Probe Tomography Studies of RF Materials

We are constructing a facility that combines an atom probe field ion microscope with a multi-element in-situ deposition and surface modification capability. This system is dedicated to rf studies and the initial goal will be to understand the properties of evaporative coatings: field emission, bonding, interdiffusion, etc., to suppress breakdown and dark currents in normal cavities. We also hope to use this system to look more generally at interactions of surface structure and high rf fields. We will present preliminary data on structures relevant to normal and superconducting rf systems.