DocumentCode :
3197199
Title :
Adhesion of moulding compounds on various surfaces. A study on moisture influence and degradation after high temperature storage
Author :
Pufall, R. ; Goroll, M. ; Bouazza, M. ; Wittler, O. ; Michel, B.
Author_Institution :
Infineon Technol. AG, Neubiberg, Germany
fYear :
2010
fDate :
13-16 Sept. 2010
Firstpage :
1
Lastpage :
3
Abstract :
It is well known that high temperature storage can degrade moulding compounds for chip encapsulation to such an extent that the adhesions to surfaces like copper (lead frames) or polyimide (chip coating) decreases drastically causing delamination. During normal operation of electronic components, heat is generated locally (bond wire, or chip surface) degrading the moulding compound and reducing the adhesion which in extreme cases can destroy the metallisation or bond wires.
Keywords :
adhesion; coating techniques; copper; metallisation; moulding; bond wires; chip coating; chip encapsulation; copper; electronic component; lead frames; metallisation; moisture influence; moulding compound adhesion; polyimide; Adhesives; Copper; Irrigation; Lead; Nickel; Semiconductor device measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic System-Integration Technology Conference (ESTC), 2010 3rd
Conference_Location :
Berlin
Print_ISBN :
978-1-4244-8553-6
Electronic_ISBN :
978-1-4244-8554-3
Type :
conf
DOI :
10.1109/ESTC.2010.5642855
Filename :
5642855
Link To Document :
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