Title :
Miniaturized rubidium clocks for space and industrial applications
Author :
Couplet, Claire ; Rochat, Pascal ; Mileti, Gaetano ; Schweda, Hartmut ; Thomann, Pierre ; Busca, Giovanni
Author_Institution :
Obs. Cantonal, Neuchatel, Switzerland
fDate :
31 May-2 Jun 1995
Abstract :
This paper describes current developments of miniature rubidium clocks based upon a magnetron cavity performed by the Neuchatel Observatory. Two variants of clocks for ground and space applications, respectively, have been developed. A brief description of both magnetron-type cavity and physics package basic characteristics is presented. The short-term stability obtained is discussed and compared with the theoretical value. The use of this cavity resonator, surrounding the absorption cell gives a repeatable short-term stability of 3 to 6×10-12×-1/2 for both ground and space version. Other parameters like temperature coefficient and long term stability have been optimised and tested. Good performances have been obtained through a careful balance between the compensation of the light shift and the buffer gas shift effects. The two versions of the clocks are as follows: The small industrial version for commercial applications has a volume of 0.25 1 and a typical power consumption of 7 W. This version is now in production. 2. The space-borne RUSO is designed for various missions. This model is now fully developed and a series of 6 flight models will be fully manufactured and tested before the end of 1995
Keywords :
atomic clocks; cavity resonators; frequency stability; measurement standards; rubidium; time measurement; 7 W; Rb; absorption cell; cavity resonator; industrial applications; long term stability; magnetron cavity; miniaturized rubidium clocks; short-term stability; space applications; temperature coefficient; Absorption; Aerospace industry; Cavity resonators; Clocks; Land surface temperature; Observatories; Packaging; Physics; Stability; Testing;
Conference_Titel :
Frequency Control Symposium, 1995. 49th., Proceedings of the 1995 IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
0-7803-2500-1
DOI :
10.1109/FREQ.1995.483882