Title :
EMG pattern recognition based on evidence accumulation for prosthesis control
Author :
Lee, Seok-pil ; Park, Sang-Hui ; Kim, Jeong-seop ; Kim, Ig-Jae
Author_Institution :
Dept. of Electr. Eng., Yonsei Univ., Seoul, South Korea
fDate :
31 Oct-3 Nov 1996
Abstract :
The authors present an EMG pattern recognition method to identify motion command for the control of a prosthetic arm by evidence accumulation with multiple parameters. The adaptive cepstrum coefficients which the authors propose in this paper, integral absolute value (IAV), difference absolute mean value (DAMV), variance and autoregressive (AR) model coefficients, are extracted as parameters by probabilistic and stochastic models. Pattern recognition is carried out through an evidence accumulation procedure with the distances measured with reference parameters. A fuzzy mapping function is designed to transform the distances. A recognition comparison test is provided to show the superiority of the suggested recognition method. A separability comparison test is also provided to evaluate the feasibility of the adaptive cepstrum coefficients extracted by the proposed approach
Keywords :
artificial limbs; biocontrol; electromyography; feature extraction; medical signal processing; parameter estimation; pattern recognition; EMG pattern recognition; adaptive cepstrum coefficients; autoregressive coefficients; difference absolute mean value; evidence accumulation; fuzzy mapping function; integral absolute value; motion command identification; multiple parameters; probabilistic models; prosthesis control; prosthetic arm; reference parameters; separability comparison test; stochastic models; variance; Biological system modeling; Cepstrum; Electromyography; Estimation error; Feature extraction; Pattern recognition; Prosthetics; Signal processing; Stochastic processes; Testing;
Conference_Titel :
Engineering in Medicine and Biology Society, 1996. Bridging Disciplines for Biomedicine. Proceedings of the 18th Annual International Conference of the IEEE
Conference_Location :
Amsterdam
Print_ISBN :
0-7803-3811-1
DOI :
10.1109/IEMBS.1996.647514