• DocumentCode
    3197324
  • Title

    Fine pitch copper wire bonding introduction to high volume production

  • Author

    Appelt, Bernd K. ; Tseng, Andy ; Lai, Yi-Shao

  • Author_Institution
    ASE Group Inc., Santa Clara, CA, USA
  • fYear
    2010
  • fDate
    13-16 Sept. 2010
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Wire bonding has been the dominant mode of chip to substrate interconnection for many decades. The most common metal used has been gold which is rather malleable and very resistant to oxidation and corrosion. The surge in commodity prices over the last few years has prompted the introduction of copper as a lower cost alternative. While copper has some advantages electrically, thermally and mechanically, it presents also many challenges due to the mechanical properties as well as its propensity for oxidation and corrosion. Here, the successful introduction of fine diameter copper wire bonding into high volume manufacturing is described.
  • Keywords
    copper; corrosion; fine-pitch technology; integrated circuit interconnections; lead bonding; oxidation; commodity prices; corrosion; fine diameter copper wire bonding; fine pitch copper wire bonding; high volume production; malleable; mechanical property; oxidation; substrate interconnection; Bonding; Copper; Gold; Radio access networks; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic System-Integration Technology Conference (ESTC), 2010 3rd
  • Conference_Location
    Berlin
  • Print_ISBN
    978-1-4244-8553-6
  • Electronic_ISBN
    978-1-4244-8554-3
  • Type

    conf

  • DOI
    10.1109/ESTC.2010.5642861
  • Filename
    5642861