DocumentCode
3197324
Title
Fine pitch copper wire bonding introduction to high volume production
Author
Appelt, Bernd K. ; Tseng, Andy ; Lai, Yi-Shao
Author_Institution
ASE Group Inc., Santa Clara, CA, USA
fYear
2010
fDate
13-16 Sept. 2010
Firstpage
1
Lastpage
5
Abstract
Wire bonding has been the dominant mode of chip to substrate interconnection for many decades. The most common metal used has been gold which is rather malleable and very resistant to oxidation and corrosion. The surge in commodity prices over the last few years has prompted the introduction of copper as a lower cost alternative. While copper has some advantages electrically, thermally and mechanically, it presents also many challenges due to the mechanical properties as well as its propensity for oxidation and corrosion. Here, the successful introduction of fine diameter copper wire bonding into high volume manufacturing is described.
Keywords
copper; corrosion; fine-pitch technology; integrated circuit interconnections; lead bonding; oxidation; commodity prices; corrosion; fine diameter copper wire bonding; fine pitch copper wire bonding; high volume production; malleable; mechanical property; oxidation; substrate interconnection; Bonding; Copper; Gold; Radio access networks; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic System-Integration Technology Conference (ESTC), 2010 3rd
Conference_Location
Berlin
Print_ISBN
978-1-4244-8553-6
Electronic_ISBN
978-1-4244-8554-3
Type
conf
DOI
10.1109/ESTC.2010.5642861
Filename
5642861
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