• DocumentCode
    3197401
  • Title

    X-ray resistant packaging for X-ray line detectors

  • Author

    Oppermann, Martin ; Lohse, Thomas ; Metasch, René ; Zerna, Thomas ; Wolter, Klaus-Jürgen

  • Author_Institution
    Electron. Packaging Lab. (IAVT), Tech. Univ. Dresden, Dresden, Germany
  • fYear
    2010
  • fDate
    13-16 Sept. 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The challenges of electronics packaging and system integration require new non-destructive evaluation (NDE) techniques during production processes for fast and reliable detecting of small defects like shorts, missing parts or contacts and voids. X-ray techniques like radiography, limited angle tomography and computed tomography are very important methods. Today the common detector principle for X-rays is the so called scintillation detector with a CCD camera behind. But more and more the industry needs fast, reliable and low-cost X-ray systems. That´s why direct converting line detectors are on the engineers focus to be used for “real-time” X-ray scanners. Our paper presents the development of a X-ray resistant detector´s module packaging.
  • Keywords
    X-ray apparatus; X-ray detection; electronics packaging; modules; CCD camera; X-ray line detectors; X-ray resistant detector; X-ray resistant packaging; X-ray scanners; electronics packaging; module packaging; nondestructive evaluation; scintillation detector; Detectors; Photonics; Pixel; Tin;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic System-Integration Technology Conference (ESTC), 2010 3rd
  • Conference_Location
    Berlin
  • Print_ISBN
    978-1-4244-8553-6
  • Electronic_ISBN
    978-1-4244-8554-3
  • Type

    conf

  • DOI
    10.1109/ESTC.2010.5642865
  • Filename
    5642865