DocumentCode :
3197401
Title :
X-ray resistant packaging for X-ray line detectors
Author :
Oppermann, Martin ; Lohse, Thomas ; Metasch, René ; Zerna, Thomas ; Wolter, Klaus-Jürgen
Author_Institution :
Electron. Packaging Lab. (IAVT), Tech. Univ. Dresden, Dresden, Germany
fYear :
2010
fDate :
13-16 Sept. 2010
Firstpage :
1
Lastpage :
4
Abstract :
The challenges of electronics packaging and system integration require new non-destructive evaluation (NDE) techniques during production processes for fast and reliable detecting of small defects like shorts, missing parts or contacts and voids. X-ray techniques like radiography, limited angle tomography and computed tomography are very important methods. Today the common detector principle for X-rays is the so called scintillation detector with a CCD camera behind. But more and more the industry needs fast, reliable and low-cost X-ray systems. That´s why direct converting line detectors are on the engineers focus to be used for “real-time” X-ray scanners. Our paper presents the development of a X-ray resistant detector´s module packaging.
Keywords :
X-ray apparatus; X-ray detection; electronics packaging; modules; CCD camera; X-ray line detectors; X-ray resistant detector; X-ray resistant packaging; X-ray scanners; electronics packaging; module packaging; nondestructive evaluation; scintillation detector; Detectors; Photonics; Pixel; Tin;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic System-Integration Technology Conference (ESTC), 2010 3rd
Conference_Location :
Berlin
Print_ISBN :
978-1-4244-8553-6
Electronic_ISBN :
978-1-4244-8554-3
Type :
conf
DOI :
10.1109/ESTC.2010.5642865
Filename :
5642865
Link To Document :
بازگشت