Title : 
X-ray resistant packaging for X-ray line detectors
         
        
            Author : 
Oppermann, Martin ; Lohse, Thomas ; Metasch, René ; Zerna, Thomas ; Wolter, Klaus-Jürgen
         
        
            Author_Institution : 
Electron. Packaging Lab. (IAVT), Tech. Univ. Dresden, Dresden, Germany
         
        
        
        
        
        
            Abstract : 
The challenges of electronics packaging and system integration require new non-destructive evaluation (NDE) techniques during production processes for fast and reliable detecting of small defects like shorts, missing parts or contacts and voids. X-ray techniques like radiography, limited angle tomography and computed tomography are very important methods. Today the common detector principle for X-rays is the so called scintillation detector with a CCD camera behind. But more and more the industry needs fast, reliable and low-cost X-ray systems. That´s why direct converting line detectors are on the engineers focus to be used for “real-time” X-ray scanners. Our paper presents the development of a X-ray resistant detector´s module packaging.
         
        
            Keywords : 
X-ray apparatus; X-ray detection; electronics packaging; modules; CCD camera; X-ray line detectors; X-ray resistant detector; X-ray resistant packaging; X-ray scanners; electronics packaging; module packaging; nondestructive evaluation; scintillation detector; Detectors; Photonics; Pixel; Tin;
         
        
        
        
            Conference_Titel : 
Electronic System-Integration Technology Conference (ESTC), 2010 3rd
         
        
            Conference_Location : 
Berlin
         
        
            Print_ISBN : 
978-1-4244-8553-6
         
        
            Electronic_ISBN : 
978-1-4244-8554-3
         
        
        
            DOI : 
10.1109/ESTC.2010.5642865