DocumentCode :
3197420
Title :
Diffraction properties of multi-layer holograms
Author :
Fitio, V.M. ; Bobitski, Ya.W.
Author_Institution :
Nat. Univ., Lviv, Ukraine
fYear :
2001
fDate :
2001
Firstpage :
206
Abstract :
Based on the theory of connected waves the peculiarities of diffraction of light on multi-layered holograms was analysed. For two-edged holograms depending on diffraction efficiency from wavelength of the falling light one can observe oscillations, the period of which can be generally determined by the distance between the subholograms. For a multilayered hologram consisting of subholograms depending on the diffraction efficiency from the wavelength only every m-l peak has a big amplitude, the angle´s width of this peak and the amplitudes of other peaks decrease with the increase of m. This case represents a multi-layer interferometer. The recording of a multilayered hologram can be done with the help of a simple hologram. Two edged and multilayered holograms as a matter of fact represent indivisible two rays and multi ray interferometers
Keywords :
holography; light diffraction; light interferometers; optical multilayers; diffraction efficiency; multi ray interferometers; multi-layer hologram diffraction properties; multi-layer interferometer; multilayered hologram; multilayered holograms; oscillations; two-edged holograms; Diffraction; Displacement measurement; Frequency measurement; Goniometers; Laser stability; Laser transitions; Optical reflection; Semiconductor lasers; Wavelength measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Laser and Fiber-Optical Networks Modeling, 2001. Proceedings of LFNM 2001. 3rd International Workshop on
Conference_Location :
Kharkiv
Print_ISBN :
0-7803-6680-8
Type :
conf
DOI :
10.1109/LFNM.2001.930247
Filename :
930247
Link To Document :
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